Characterization Of Metalferroelectric-Insulator-Semiconductor Structures Based On Ferroelectric Langmuir-Blodgett Polyvinylidene Fluoride Copolymer Films For Nondestructive Random Access Memory Applications
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Book Details :
Characterization Of Metalferroelectric-Insulator-Semiconductor Structures Based On Ferroelectric Langmuir-Blodgett Polyvinylidene Fluoride Copolymer Films For Nondestructive Random Access Memory Applications